Senior Institute Fellow
- Nanomaterials characterization using synchrotron X-rays and understanding mechanisms of structure formation
Dr. Lee is physicist of Argonne National Laboratory.
He received his ph.D. in chemistry with Prof. Moonhor Ree at POSTECH in Korea by studying structures of polymers and low-dielectric thin films using small angle x-ray scattering (SAXS) and grazing incidence SAXS. In 2004, He joined Advanced Photon Source at Argonne National Laboratory as postdoctoral scholar and then became staff scientist.
His research interests focus on nanomaterials characterization using synchrotron X-rays and understanding mechanisms of structure formation. He was awarded the Young Scientist Award from the IUCr small angle scattering committee in 2006 and served as a chair of the small angle scattering interest group of the American Crystallography Association.